HISTORY

More 25 years than SCANTECH is developing around the world.

 

2019

New µOF Scanner for the automotive market for electric vehicles.

Measuring the materials that make up the Li-ion batteries.

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2018

New research and development building in France

2018

Creation of a subsidiary in Germany

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2017

  • New network of agents in Europe
  • New generation of “Ultra-Light frames ULO3”
  • SCANTECH develops a new INFRA-red scanner

2016

New offices in China

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2013

Creating a subsidiary in India

2012

New office in Malaysia and South Korea

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2009

SCANTECH develops products for the metal industries

2008

New range of HF1 scanners

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2007

Double sensor with X-rays or infrared for thickness and humidity

2005

  • Creation of SCANTECH America
  • Creation of SCANTECH China

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2003

  • SCANTECH becomes totally independent and private
  • SSA1 Advanced Software

2001

Double sensor with X-rays and laser for density

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1999

Laser sensor for thickness measurement

1997

First supervision and online monitoring system

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1992

SCANTECH is created by a team of scientists:

  • Jean Jacques Florent
  • Jan Gauden

A patent is filed for the low energy X-Ray sensor