HISTORY
30 Years than SCANTECH is developing around the world.
2019
New µOF Scanner for the automotive market for electric vehicles.
Measuring the materials that make up the Li-ion batteries.
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2018
New research and development building in France
2018
Creation of a subsidiary in Germany
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2017
- New network of agents in Europe
- New generation of “Ultra-Light frames ULO3”
- SCANTECH develops a new INFRA-red scanner
2016
New offices in China
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2013
Creating a subsidiary in India
2012
New office in Malaysia and South Korea
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2009
SCANTECH develops products for the metal industries
2008
New range of HF1 scanners
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2007
Double sensor with X-rays or infrared for thickness and humidity
2005
- Creation of SCANTECH America
- Creation of SCANTECH China
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2003
- SCANTECH becomes totally independent and private
- SSA1 Advanced Software
2001
Double sensor with X-rays and laser for density
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1999
Laser sensor for thickness measurement
1997
First supervision and online monitoring system
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1992
SCANTECH is created by a team of scientists:
- Jean Jacques Florent
- Jan Gauden
A patent is filed for the low energy X-Ray sensor